3 results
Atom Probe Tomography of Oxidised Grain Boundaries in Highly Irradiated SS316
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2532-2533
- Print publication:
- August 2019
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Model for electron-beam-induced crystallization of amorphous Me–Si–C (Me = Nb or Zr) thin films
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- Journal:
- Journal of Materials Research / Volume 29 / Issue 23 / 14 December 2014
- Published online by Cambridge University Press:
- 21 November 2014, pp. 2854-2862
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- 14 December 2014
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Beam-induced crystallization of amorphous Me–Si–C (Me = Nb or Zr) thin films during transmission electron microscopy
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- Journal:
- MRS Communications / Volume 3 / Issue 3 / September 2013
- Published online by Cambridge University Press:
- 28 August 2013, pp. 151-155
- Print publication:
- September 2013
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